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KMID : 0385519890020020317
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Analytical Science & Technology
1989 Volume.2 No. 2 p.317 ~ p.321
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Quantitative Analysis of Y₂O₃-Y₂O₂S Binary Mixture by X-Ray Diffraction Method
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김영만/Kim, Young Man
정찬이/김창홍/이종욱/Jeong, Chan Yee/Kim, Chang Hong/Lee, Chong Wook
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Abstract
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X-ray diffraction method, Quantitative analysis of
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KEYWORD
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